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表面轮廓仪

Surface Profilometers

Model No. SUP-0005 · Surface Analysis Instruments

Atomic Force Microscope Profilometer for Nanoscale Roughness

纳米尺度粗糙度用原子力显微轮廓仪

When wafers, thin films or graphene need roughness at the atomic scale, an AFM is the only practical choice. Scans cover up to 90 × 90 µm with about 10 µm Z range and vertical noise below 0.05 nm RMS. Contact, tapping and non-contact modes are included, at up to 4096 × 4096 pixels. Samples up to 100 mm diameter and 20 mm thick fit.

Scan range (XY)
Up to 90 × 90 µm
Z range
≈ 10 µm
Vertical noise
< 0.05 nm RMS
Lateral resolution
≈ 1–5 nm
Imaging modes
Contact, tapping, non-contact
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Packing & Shipping

Place of originChina (dispatched from Shanghai)
BrandLiquid International / OEM on request
Export packingFumigation-free plywood case or reinforced carton
Loading portShanghai / Ningbo (others on request)
Payment termsT/T, L/C at sight (confirmed on quotation)
Trade termsEXW, FOB, CFR, CIF, DAP

Typical export terms — final terms are confirmed on the proforma invoice.

Product Description 产品描述

When wafers, thin films or graphene need roughness at the atomic scale, an AFM is the only practical choice. Scans cover up to 90 × 90 µm with about 10 µm Z range and vertical noise below 0.05 nm RMS. Contact, tapping and non-contact modes are included, at up to 4096 × 4096 pixels. Samples up to 100 mm diameter and 20 mm thick fit.

Highlights

  • Vertical noise below 0.05 nm RMS
  • Three imaging modes for hard and soft samples
  • Images up to 4096 × 4096 pixels
  • Holds samples up to 100 mm across

Applications

  • Wafer and substrate nanoroughness
  • Thin film and polymer morphology
  • Nanomaterial and graphene imaging
  • Optical coating defects

Specifications 技术参数

ParameterValue
Scan range (XY) 扫描范围(XY) Up to 90 × 90 µm
Z range Z 向范围 ≈ 10 µm
Vertical noise 垂直噪声 < 0.05 nm RMS
Lateral resolution 横向分辨率 ≈ 1–5 nm
Imaging modes 成像模式 Contact, tapping, non-contact
Image resolution 图像分辨率 Up to 4096 × 4096 px
Sample size 样品尺寸 Up to 100 mm diameter, 20 mm thick
Scan speed 扫描速度 0.1–30 Hz line rate
Tip radius 针尖半径 2–10 nm typical
Isolation 隔振 Active table and acoustic hood
Model No.SUP-0005
Place of originChina (dispatched from Shanghai)

Applicable standards 适用标准

ISO 4287 ISO 21920-2 ISO 25178-2 ISO 4288 ASTM D7127

Chinese national standards (GB/T, JJG) and international standards referenced for this product type. Test reports and certificates are supplied with the quotation on request.

Packing & Shipping 包装与运输

Export packing

Fumigation-free plywood case or reinforced carton

Every unit is power-tested before packing; enclosed in shock foam and moisture barrier; wooden cases comply with ISPM 15.

Loading port

Shanghai / Ningbo (others on request)

Full container load (FCL), less-than-container load (LCL) or air freight; complete export documentation provided.

Inquiry Now 索取报价

Complete the form below — an export engineer will send technical configurations and a formal proforma invoice within 24 hours.

Products in this inquiry: Atomic Force Microscope Profilometer for Nanoscale Roughness (SUP-0005)

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