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台式 X 射线荧光光谱仪

Benchtop XRF

Model No. BEX-0006 · X-Ray Analysis Instruments

Benchtop Polarized XRF Spectrometer

台式偏振 XRF 光谱仪

Labs needing trace elements in soils, plants or plastics on a benchtop can lower their limits with polarised secondary-target excitation. This XRF reaches typical limits of 0.1–10 mg/kg from Na to U, runs a 100–400 W tube and measures in 300–1800 s. Pressed pellets and thin films give the best results. Tell us your element list.

Element range
Na to U
Detection limit
0.1–10 mg/kg typical
Excitation
polarized with secondary targets
X-ray tube power
100–400 W
Detector
silicon drift detector
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Packing & Shipping

Place of originChina (dispatched from Shanghai)
BrandLiquid International / OEM on request
Export packingFumigation-free plywood case or reinforced carton
Loading portShanghai / Ningbo (others on request)
Payment termsT/T, L/C at sight (confirmed on quotation)
Trade termsEXW, FOB, CFR, CIF, DAP

Typical export terms — final terms are confirmed on the proforma invoice.

Product Description 产品描述

Labs needing trace elements in soils, plants or plastics on a benchtop can lower their limits with polarised secondary-target excitation. This XRF reaches typical limits of 0.1–10 mg/kg from Na to U, runs a 100–400 W tube and measures in 300–1800 s. Pressed pellets and thin films give the best results. Tell us your element list.

Highlights

  • Polarised geometry lowers scattered background
  • Trace performance from a benchtop footprint
  • Secondary targets tuned to element groups
  • Air or vacuum measurement

Applications

  • Trace elements in soils and sediments
  • Geological and mining samples
  • Biological and plant material
  • Plastics, waste and recycled materials

Specifications 技术参数

ParameterValue
Element range 元素范围 Na to U
Detection limit 检出限 0.1–10 mg/kg typical
Excitation 激发方式 polarized with secondary targets
X-ray tube power X 射线管功率 100–400 W
Detector 检测器 silicon drift detector
Measurement time 测量时间 300–1800 s
Sample form 样品形态 pressed pellets, thin films
Atmosphere 测量气氛 air or vacuum
Enclosure 外壳 shielded with interlocks
Interface 通信接口 Ethernet
Model No.BEX-0006
Place of originChina (dispatched from Shanghai)

Applicable standards 适用标准

ASTM E1621 Wavelength dispersive X-ray fluorescence IEC 62321 Determination of restricted substances in electrotechnical products ISO 3497 Metallic coatings — X-ray spectrometric thickness ASTM D4294 Sulfur in petroleum products by EDXRF IEC 61010-2-091 ISO/IEC 17025

Chinese national standards (GB/T, JJG) and international standards referenced for this product type. Test reports and certificates are supplied with the quotation on request.

Packing & Shipping 包装与运输

Export packing

Fumigation-free plywood case or reinforced carton

Every unit is power-tested before packing; enclosed in shock foam and moisture barrier; wooden cases comply with ISPM 15.

Loading port

Shanghai / Ningbo (others on request)

Full container load (FCL), less-than-container load (LCL) or air freight; complete export documentation provided.

Inquiry Now 索取报价

Complete the form below — an export engineer will send technical configurations and a formal proforma invoice within 24 hours.

Products in this inquiry: Benchtop Polarized XRF Spectrometer (BEX-0006)

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Single instruments, complete laboratories or government tenders — our export engineers prepare the configuration, proforma invoice and shipping documents.