Model No. XRD-0004
Micro-Focus X-Ray Diffractometer微聚焦 X 射线衍射仪
- Beam size
- 10–200 µm
- 2-theta range
- 0–90° with 2D detector
X 射线荧光光谱仪
XRF
Photo for reference; configuration may vary by order.
Model No. XRF-0003 · X-Ray Analysis Instruments
Total Reflection X-Ray Fluorescence Spectrometer
全反射 X 射线荧光光谱仪
Semiconductor fabs and ultrapure water labs measure metals at picogram levels from tiny deposits. TXRF does this by striking a polished quartz or silicon carrier below 0.1°, so only 1–50 µL of sample is needed for elements from Na to U. Excitation is by X-ray tube or synchrotron. Ask us about sample preparation and internal standards.
- Element range
- Na to U
- Detection limit
- picogram to nanogram range
- Sample volume
- 1–50 µL
- Incidence angle
- below critical angle, < 0.1°
- Carrier
- polished quartz or silicon wafer
Packing & Shipping
| Place of origin | China (dispatched from Shanghai) |
|---|---|
| Brand | Liquid International / OEM on request |
| Export packing | Fumigation-free plywood case or reinforced carton |
| Loading port | Shanghai / Ningbo (others on request) |
| Payment terms | T/T, L/C at sight (confirmed on quotation) |
| Trade terms | EXW, FOB, CFR, CIF, DAP |
Typical export terms — final terms are confirmed on the proforma invoice.
Product Description 产品描述
Semiconductor fabs and ultrapure water labs measure metals at picogram levels from tiny deposits. TXRF does this by striking a polished quartz or silicon carrier below 0.1°, so only 1–50 µL of sample is needed for elements from Na to U. Excitation is by X-ray tube or synchrotron. Ask us about sample preparation and internal standards.
Highlights
- Picogram to nanogram detection from microlitre samples
- Simple internal standard quantification
- Very low background from total reflection geometry
- Air or vacuum operation
Applications
- Semiconductor wafer surface contamination
- Ultratrace metals in ultrapure water
- Biological fluids and tissue digests
- Reference material and nanomaterial analysis
Specifications 技术参数
| Parameter | Value |
|---|---|
| Element range 元素范围 | Na to U |
| Detection limit 检出限 | picogram to nanogram range |
| Sample volume 样品体积 | 1–50 µL |
| Incidence angle 入射角 | below critical angle, < 0.1° |
| Carrier 载体 | polished quartz or silicon wafer |
| Excitation 激发 | X-ray tube or synchrotron |
| Detector 检测器 | silicon drift or Si(Li) |
| Atmosphere 测量气氛 | air or vacuum |
| Measurement time 测量时间 | 100–1000 s |
| Interface 通信接口 | Ethernet / USB |
| Model No. | XRF-0003 |
| Place of origin | China (dispatched from Shanghai) |
Applicable standards 适用标准
ASTM E1621 Wavelength dispersive X-ray fluorescence
ASTM D4294 Sulfur in petroleum products by EDXRF
ISO 3497 Metallic coatings — X-ray spectrometric thickness
IEC 62321 Determination of restricted substances in electrotechnical products
US EPA Method 6200 Field portable XRF for soil
ISO 13196 Soil quality — Screening of selected elements by EDXRF
IEC 61010-2-091
ISO/IEC 17025
Chinese national standards (GB/T, JJG) and international standards referenced for this product type. Test reports and certificates are supplied with the quotation on request.
Packing & Shipping 包装与运输
Export packing
Fumigation-free plywood case or reinforced carton
Every unit is power-tested before packing; enclosed in shock foam and moisture barrier; wooden cases comply with ISPM 15.
Loading port
Shanghai / Ningbo (others on request)
Full container load (FCL), less-than-container load (LCL) or air freight; complete export documentation provided.
Inquiry Now 索取报价
Complete the form below — an export engineer will send technical configurations and a formal proforma invoice within 24 hours.
Related products
5 models
Model No. XRF-0001
Energy-Dispersive X-Ray Fluorescence Spectrometer能量色散 X 射线荧光光谱仪
- Element range
- Na to U (Mg to U in air)
- Detection limit
- 1–100 mg/kg typical
Model No. XRF-0002
Wavelength-Dispersive X-Ray Fluorescence Spectrometer波长色散 X 射线荧光光谱仪
- Element range
- Be or B to U
- Detection limit
- 0.1–10 mg/kg typical
Model No. XRF-0004
Micro X-Ray Fluorescence Spectrometer微区 X 射线荧光光谱仪
- Spot size
- 10–100 µm
- Element range
- Na to U
Model No. XRF-0005
Polarized Energy-Dispersive X-Ray Fluorescence Spectrometer偏振能量色散 X 射线荧光光谱仪
- Element range
- Na to U
- Detection limit
- 0.1–10 mg/kg typical