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X 射线衍射仪

X-Ray Diffractometers

Model No. XRA-0004 · X-Ray Analysis Instruments

X-Ray Reflectometry Diffractometer

X 射线反射率衍射仪

Multilayer coatings, polymer films and semiconductor stacks are specified by thickness, density and interface roughness, which reflectometry measures directly. This instrument scans 0–10° in steps down to 0.001°, determines thickness from 0.3 to 500 nm and roughness of 0.1–5 nm. Samples need flatness better than 1 nm RMS. Tell us your layer structure.

Angular range
0–10°
Thickness range
0.3 nm to 500 nm
Roughness resolution
0.1–5 nm
Angular step
down to 0.001°
Detector
scintillation or area detector
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Packing & Shipping

Place of originChina (dispatched from Shanghai)
BrandLiquid International / OEM on request
Export packingFumigation-free plywood case or reinforced carton
Loading portShanghai / Ningbo (others on request)
Payment termsT/T, L/C at sight (confirmed on quotation)
Trade termsEXW, FOB, CFR, CIF, DAP

Typical export terms — final terms are confirmed on the proforma invoice.

Product Description 产品描述

Multilayer coatings, polymer films and semiconductor stacks are specified by thickness, density and interface roughness, which reflectometry measures directly. This instrument scans 0–10° in steps down to 0.001°, determines thickness from 0.3 to 500 nm and roughness of 0.1–5 nm. Samples need flatness better than 1 nm RMS. Tell us your layer structure.

Highlights

  • Non-destructive thickness and density measurement
  • Fine angular steps for thick or multilayer stacks
  • Interface roughness quantified in nanometres
  • Works on crystalline and amorphous films

Applications

  • Single and multilayer film thickness
  • Interface roughness and interdiffusion
  • Polymer and organic thin films
  • Semiconductor and optical coating quality

Specifications 技术参数

ParameterValue
Angular range 角度范围 0–10°
Thickness range 厚度范围 0.3 nm to 500 nm
Roughness resolution 粗糙度分辨率 0.1–5 nm
Angular step 角度步进 down to 0.001°
Detector 检测器 scintillation or area detector
X-ray tube power X 射线管功率 1–3 kW
Optics 光学 parallel beam or monochromator
Sample flatness 样品平整度 better than 1 nm RMS
Sample size 样品尺寸 up to 200 mm wafers
Interface 通信接口 Ethernet
Model No.XRA-0004
Place of originChina (dispatched from Shanghai)

Applicable standards 适用标准

ASTM E915 Verifying the alignment of X-ray diffraction instrumentation ASTM E1426 Determining the effective elastic parameter for X-ray diffraction measurements of residual stress USP <941> X-Ray Diffraction ISO 20203 Carbonaceous materials — XRD of calcined coke ISO/IEC 17025 IEC 61010-2-091

Chinese national standards (GB/T, JJG) and international standards referenced for this product type. Test reports and certificates are supplied with the quotation on request.

Packing & Shipping 包装与运输

Export packing

Fumigation-free plywood case or reinforced carton

Every unit is power-tested before packing; enclosed in shock foam and moisture barrier; wooden cases comply with ISPM 15.

Loading port

Shanghai / Ningbo (others on request)

Full container load (FCL), less-than-container load (LCL) or air freight; complete export documentation provided.

Inquiry Now 索取报价

Complete the form below — an export engineer will send technical configurations and a formal proforma invoice within 24 hours.

Products in this inquiry: X-Ray Reflectometry Diffractometer (XRA-0004)

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